A customizable platform for FPGA adaptation & resilience

At advanced nodes, every device is different.

Variation and latent defects force sign-off to guardband every device for the slowest silicon at the worst-case corner. That conservatism costs performance and energy, and it still misses the defects that fail in the field. Fluid Silicon measures every device at speed, in-system, exposes those defects and keeps each device inside its measured margin.

AMD and Altera devicesNo RTL changesRead-only by defaultDeployed on-premises

Measured in-system
every LUT and carry chain, at speed
Per-device result
example: worst slack 8.2%, at X84Y212
Illustrative screen with example data.

In the field

Timing failures sign-off never sees.

One cause: variation and latent defects make each device's real margin different, and nothing measures it after sign-off. That margin varies across the die and shrinks with temperature and age. Monitoring is read-only; tuning and repair are separate steps you enable.

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The measurement

Measured on production shells, at realistic utilization.

30–54%*
timing margin a chip carries today for the worst-case corner
< 20 ps
per-link measurement precision, error plus drift
1 s
to measure every logic element on a chip
< 1%
of LUTs, and under 5% of flip-flops, on a production shell
< 2%
delay impact on your design
0
downtime while monitoring runs

*Fluid Silicon measurements. Varies with variation pattern, workload, vendor and device age.

How it works

Measure every device at speed. Keep it inside its margin.

A device is characterized once, against the slowest silicon at the worst-case corner, and runs on that assumption for life. Fluid Silicon adds a lightweight health layer alongside your design that measures setup slack in-system, at operating frequency, for as long as the device runs.

Measured in-system

Setup slack on individual LUTs, carry chains and the routing between them, while your design runs. A full sweep takes about a second; each link is resolved to under 20 ps.

Modeled per device

An aging curve fitted to each device's temperature history, with a time-to-threshold for every element on the die.

Held within measured margin

Vccint and clock follow the margin each device has measured, never past it, in maintenance windows you schedule, re-measured after every change.

Repaired only when needed

Nothing in your design moves until an element degrades toward your threshold. Then only that path is re-placed onto healthy resources, through your change process.

How the measurement works · Device support

Why now

The gap between sign-off and silicon keeps widening.

Guardbanding every device for the slowest silicon made sense when nothing could be measured in the field. Three things have changed.

> 20%

Variation is a first-order constraint

At 16, 14 and 7 nm, random variation alone exceeds 20%, on top of systematic variation and latent defects across the die. Two devices with the same part number and speed grade are less alike with every node.

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6+ years

Devices outlive their timing models

Boards stay in service for six years and more, and a device in a hot enclosure ages faster than the same part in a cool one. Sign-off happens once; the silicon keeps changing.

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Per device

In-system measurement is now practical

FPGAs are reprogrammable after they ship, so a health layer can be added to devices already in service, with no new silicon. Each device's margin is measured instead of assumed from the slowest one.

Read more

Margin and precision figures are Fluid Silicon measurements and vary with variation pattern, workload, vendor and age.

Where this goes

FPGAs are where we start.

A device that measures its own timing belongs wherever silicon has to be trusted. FPGAs are reprogrammable, so the health layer can be added to devices already in service, with no new silicon. That makes them the first step.

1

Today: FPGAs, read-only

Per-element measurement on AMD and Altera devices, with evaluations that start on a few of your boards.

2

Next: the full loop on every device

Each device monitored, modeled, tuned and, when needed, repaired on its own measurement: on the bench, in a vehicle, in a cabinet or in a data center.

3

After that: beyond FPGAs

The same per-element measurement for other silicon that has to run for years, so no system fails because a part ran out of margin unnoticed.

Who we are

Grounded in decades of FPGA research.

Fluid Silicon is a Philadelphia company building reliability software for FPGAs. The approach comes from reconfigurable-computing research at the University of Pennsylvania.

Nhlanhla Mavuso

Nhlanhla Mavuso

Co-Founder and CEO

Nhlanhla developed the approach behind Fluid Silicon through master's research at the University of Pennsylvania on online health monitoring and runtime repair for commercial FPGAs.

  • BA Physics, Penn 2026
  • BSE Computer Engineering, Penn 2026
  • MSE Electrical Engineering, Penn 2026
  • VIPER Class of 2026
  • President's Sustainability Prize, 2026
Dr. André DeHon

Dr. André DeHon

Co-Founder and Chief Scientific Advisor

André has worked in reconfigurable computing for decades, at Berkeley, Caltech and, since 2006, the University of Pennsylvania, where he is the Oliver C. Boileau Jr. and Nan Eleze Boileau Professor of Electrical Engineering. His research on FPGA architecture and interconnect underpins Fluid Silicon's approach.

  • SB, SM, PhD, MIT
  • ACM Fellow
  • IEEE Fellow
  • NAI Fellow
  • 10 papers in the TCFPGA Hall of Fame
  • Chair, ACM SIGDA TC on FPGAs
Victor Kogo

Victor Kogo

Head of Business Development

Victor works with the founders on Fluid Silicon's business strategy, its engagement with customers, partners and funders, and the financial analysis behind those decisions. He studied economics at the Wharton School and spent two summers at Boston Consulting Group before joining.

  • BS Economics, Wharton, Penn 2026
  • Boston Consulting Group, Summer Associate

Measure a device at speed, live.

A 30-minute session: in-system slack measurements on a supported AMD or Altera device, and what an evaluation on your boards involves.